| dc.creator | EMMANUEL TORRES RIOS | |
| dc.creator | REYDEZEL TORRES TORRES | |
| dc.creator | EDMUNDO ANTONIO GUTIERREZ DOMINGUEZ | |
| dc.date | 2009 | |
| dc.date.accessioned | 2022-10-12T19:59:14Z | |
| dc.date.available | 2022-10-12T19:59:14Z | |
| dc.identifier | http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1285 | |
| dc.identifier.uri | https://repositorioslatinoamericanos.uchile.cl/handle/2250/4126338 | |
| dc.description | A procedure to analyze the effect of the MOSFET drain-bulk junction tunneling current at high frequencies is presented. This procedure allows identifying the presence of band-to-band tunneling in short channel-length MOSFETs at different drain-to-source voltages. Since this analysis is based on experimental S-parameters performed to a single MOSFET, the procedure is not affected by the variations occurring in devices with different geometries. Excellent correlation between simulated and experimental output impedance for a 0.1μm channel-length bulk MOSFET up to 40GHz demonstrates the validity of the proposed technique. | |
| dc.format | application/pdf | |
| dc.language | eng | |
| dc.publisher | Elsevier Ltd. | |
| dc.relation | citation:Torres-Rios, E., et al., (2009). Analysis of the impact of the drain-junction tunneling effect on a microwave MOSFET from S-parameter measurements, Solid-State Electronics (53): 145–149 | |
| dc.rights | info:eu-repo/semantics/openAccess | |
| dc.rights | http://creativecommons.org/licenses/by-nc-nd/4.0 | |
| dc.subject | info:eu-repo/classification/MOSFETs/MOSFETs | |
| dc.subject | info:eu-repo/classification/Scattering parameters measurement/Scattering parameters measurement | |
| dc.subject | info:eu-repo/classification/Semiconductor device modeling/Semiconductor device modeling | |
| dc.subject | info:eu-repo/classification/cti/1 | |
| dc.subject | info:eu-repo/classification/cti/22 | |
| dc.subject | info:eu-repo/classification/cti/2203 | |
| dc.title | Analysis of the impact of the drain-junction tunneling effect on a microwave MOSFET from S-parameter measurements | |
| dc.type | info:eu-repo/semantics/article | |
| dc.type | info:eu-repo/semantics/acceptedVersion | |
| dc.audience | students | |
| dc.audience | researchers | |
| dc.audience | generalPublic | |
