Eosi: um modelo para desenvolvimento de sistemas embarcados tolerantes a falhas

Abstract

The semiconductor technologies evolutions leads devices to be developed with higher processing capability. Thus, those components have been used widely in more fields. Many industrial environment such as: oils, mines, automotives and hospitals are frequently using those devices on theirs process. Those industries activities are direct related to environment and health safe. So, it is quite important that those systems have extra safe features yield more reliability, safe and availability. The reference model eOSI that will be presented by this work is aimed to allow the development of systems under a new view perspective which can improve and make simpler the choice of strategies for fault tolerant. As a way to validate the model na architecture FPGA-based was developed.