dc.contributorUniversidade de São Paulo (USP)
dc.contributorDepartamento de Ciências Naturais
dc.contributorUniversidade Estadual Paulista (Unesp)
dc.contributorUPMC Univ. Paris 06
dc.date.accessioned2014-05-27T11:27:29Z
dc.date.accessioned2022-10-05T18:40:51Z
dc.date.available2014-05-27T11:27:29Z
dc.date.available2022-10-05T18:40:51Z
dc.date.created2014-05-27T11:27:29Z
dc.date.issued2013-01-01
dc.identifierOptical Materials, v. 35, n. 3, p. 387-396, 2013.
dc.identifier0925-3467
dc.identifierhttp://hdl.handle.net/11449/74190
dc.identifier10.1016/j.optmat.2012.09.029
dc.identifierWOS:000314743500011
dc.identifier2-s2.0-84871714657
dc.identifier0000-0003-3286-9440
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/3923154
dc.description.abstractThis paper reports on the sol-gel preparation and structural and optical characterization of new Er3+-doped SiO2-Nb 2O5 nanocomposite planar waveguides. Erbium-doped (100-x)SiO2-xNb2O5 waveguides were deposited on silica-on-silicon substrates and Si(1 0 0) by the dip-coating technique. The waveguides exhibited uniform refractive index distribution across the thickness, efficient light injection at 1538 nm, and low losses at 632 and 1538 nm. The band-gap values lied between 4.12 eV and 3.55 eV for W1-W5, respectively, showing an excellent transparency in the visible and near infrared region for the waveguides. Fourier Transform Infrared (FTIR) Spectroscopy analysis evidenced SiO2-Nb2O5 nanocomposite formation with controlled phase separation in the films. The HRTEM and XRD analyses revealed Nb2O5 orthorhombic T-phase nanocrystals dispersed in a silica-based host. Photoluminescence (PL) analysis showed a broad band emission at 1531 nm, assigned to the 4I13/2 → 4I15/2 transition of the Er3+ ions present in the nanocomposite, with a full-width at half medium of 48-68 nm, depending on the niobium content and annealing. Hence, these waveguides are excellent candidates for application in integrated optics, especially in EDWA and WDM devices. © 2012 Elsevier B.V. All rights reserved.
dc.languageeng
dc.relationOptical Materials
dc.relation2.320
dc.relation0,592
dc.rightsAcesso restrito
dc.sourceScopus
dc.subjectNiobium oxide
dc.subjectNIR emission
dc.subjectOptical properties
dc.subjectPhotonics
dc.subjectSol-gel
dc.subjectWaveguides
dc.subjectBand-gap values
dc.subjectBroadband emission
dc.subjectDip coating techniques
dc.subjectErbium doped
dc.subjectFull-width at half mediums
dc.subjectLight injection
dc.subjectNanocomposite formations
dc.subjectNiobium content
dc.subjectOptical characterization
dc.subjectPhotonic application
dc.subjectRefractive-index distribution
dc.subjectSi(1 0 0)
dc.subjectSilica-on-silicon
dc.subjectSol gel preparations
dc.subjectT-phase
dc.subjectVisible and near infrared
dc.subjectXRD analysis
dc.subjectErbium
dc.subjectFourier transform infrared spectroscopy
dc.subjectGlass ceramics
dc.subjectInfrared devices
dc.subjectNanocomposites
dc.subjectNiobium
dc.subjectPhase separation
dc.subjectPlanar waveguides
dc.subjectRefractive index
dc.subjectSilica
dc.subjectSol-gel process
dc.subjectSol-gels
dc.subjectElectric losses
dc.titleBroadband NIR emission in novel sol-gel Er3+-doped SiO 2-Nb2O5 glass ceramic planar waveguides for photonic applications
dc.typeArtigo


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