dc.contributorUniversidade Estadual de Campinas (UNICAMP)
dc.contributorUniversidade Federal de Minas Gerais (UFMG)
dc.contributorPennsylvania State University
dc.contributorUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-27T11:22:33Z
dc.date.accessioned2022-10-05T18:08:05Z
dc.date.available2014-05-27T11:22:33Z
dc.date.available2022-10-05T18:08:05Z
dc.date.created2014-05-27T11:22:33Z
dc.date.issued2007-08-17
dc.identifierApplied Physics Letters, v. 91, n. 6, 2007.
dc.identifier0003-6951
dc.identifierhttp://hdl.handle.net/11449/69820
dc.identifier10.1063/1.2764446
dc.identifier2-s2.0-34547838676
dc.identifier2-s2.0-34547838676.pdf
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/3919204
dc.description.abstractThe authors have investigated strain relaxation in InAsInGaAsInP nanowires (NW's). Transmission electron microscopy images show an additional stress field attributed to compositional modulation in the ternary layer, which disrupts NW formation and drives Ga interdiffusion into InAs, according to grazing incidence x-Ray diffraction under anomalous scattering conditions. The strain profile along the NW, however, is not significantly affected when interdiffusion is considered. Results show that the InAs NW energetic stability is preserved with the introduction of ternary buffer layer in the structure. © 2007 American Institute of Physics.
dc.languageeng
dc.relationApplied Physics Letters
dc.relation3.495
dc.relation1,382
dc.rightsAcesso restrito
dc.sourceScopus
dc.subjectDiffusion
dc.subjectIndium compounds
dc.subjectStrain relaxation
dc.subjectTransmission electron microscopy
dc.subjectX ray diffraction
dc.subjectCompositional modulation
dc.subjectStress driven interdiffusion
dc.subjectStress fields
dc.subjectTernary layers
dc.subjectNanowires
dc.titleStrain relaxation and stress-driven interdiffusion in InAsInGaAsInP nanowires
dc.typeArtigo


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