Joint X̄ and R Charts with Variable Sample Sizes and Sampling Intervals

dc.contributorUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-27T11:19:46Z
dc.date.accessioned2022-10-05T17:39:25Z
dc.date.available2014-05-27T11:19:46Z
dc.date.available2022-10-05T17:39:25Z
dc.date.created2014-05-27T11:19:46Z
dc.date.issued1999-10-01
dc.identifierJournal of Quality Technology, v. 31, n. 4, p. 387-397, 1999.
dc.identifier0022-4065
dc.identifierhttp://hdl.handle.net/11449/65859
dc.identifier2-s2.0-0000093252
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/3915724
dc.description.abstractRecent studies have shown that the X̄ chart with variable sampling intervals (VSI) and/or with variable sample sizes (VSS) detects process shifts faster than the traditional X̄ chart. This article extends these studies for processes that are monitored by both the X̄ and R charts. A Markov chain model is used to determine the properties of the joint X and R charts with variable sample sizes and sampling intervals (VSSI). The VSSI scheme improves the joint X̄ and R control chart performance in terms of the speed with which shifts in the process mean and/or variance are detected.
dc.languageeng
dc.relationJournal of Quality Technology
dc.relation2.306
dc.relation1,814
dc.rightsAcesso restrito
dc.sourceScopus
dc.subjectAdjusted Average Time to Signal
dc.subjectMarkov Chains
dc.subjectStatistical Process Control
dc.subjectVariable Sample Size
dc.subjectVariable Sampling Intervals
dc.titleJoint X̄ and R Charts with Variable Sample Sizes and Sampling Intervals
dc.typeArtigo


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