Artigo
Correlation of electrical conductivity and other vigor tests with field emergence of soybean seedlings
Fecha
1999-01-01Registro en:
Seed Science and Technology, v. 27, n. 1, p. 67-75, 1999.
0251-0952
WOS:000081977800007
2-s2.0-0032875979
8913035708076881
7087372884726559
Autor
Universidade Estadual Paulista (Unesp)
Dirección de Semillas
Resumen
Seeds from six soybean cultivars (Cristalina, IAC 31-Foscarin, IAC-15, UFV-10, IAC-14 and IAS-5) and from five soybean cultivars (IAC 31-Foscarin, IAC-15, IAC-14, IAS-5 and Iguacu) were evaluated in 1993 and 1994, respectively, in terms of physiological seed quality by the mechanical damage (MD), standard germination (SG), accelerated aging (AA), electrical conductivity (EC), and seedling field emergence (FE) tests. Significant correlations were detected between SG, AA and EC and FE. However, in terms of the cultivar or the year, the degree of association among these parameters can change based on the environmental conditions of each year.