Photoexpansion and photorefraction in oxysulphide glasses

dc.contributorUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T15:30:45Z
dc.date.accessioned2022-10-05T17:00:54Z
dc.date.available2014-05-20T15:30:45Z
dc.date.available2022-10-05T17:00:54Z
dc.date.created2014-05-20T15:30:45Z
dc.date.issued2009-11-26
dc.identifierSolid State Ionics. Amsterdam: Elsevier B.V., v. 180, n. 32-35, p. 1491-1496, 2009.
dc.identifier0167-2738
dc.identifierhttp://hdl.handle.net/11449/40065
dc.identifier10.1016/j.ssi.2009.09.011
dc.identifierWOS:000273066400001
dc.identifier6446047463034654
dc.identifier2998503841917815
dc.identifier0000-0003-3286-9440
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/3911085
dc.description.abstractOxysulphide glasses have been prepared in the pseudo binary system GeS(2.6)-Ga(2)O(3). The effect of addition of gallium oxide has been evaluated in term of thermal and optical properties. Structural behavior has been studied using Raman spectroscopy. Samples have been exposed above band gap energy (3.52 eV) varying power density and exposure time. Giant photoexpansion and photorefraction is obtained for samples containing 20% of Ga(2)O(3). (C) 2009 Elsevier B.V. All rights reserved.
dc.languageeng
dc.publisherElsevier B.V.
dc.relationSolid State Ionics
dc.relation2.751
dc.relation0,856
dc.rightsAcesso restrito
dc.sourceWeb of Science
dc.subjectGeS(2)
dc.subjectOxysulphide
dc.subjectPhotoexpansion
dc.subjectPhotorefraction
dc.subjectRaman spectroscopy
dc.titlePhotoexpansion and photorefraction in oxysulphide glasses
dc.typeArtigo


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