Using shifts in the electronic emission curve to evaluate polymer surface degradation

dc.contributorUniversidade de São Paulo (USP)
dc.contributorUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T15:30:39Z
dc.date.accessioned2022-10-05T17:00:19Z
dc.date.available2014-05-20T15:30:39Z
dc.date.available2022-10-05T17:00:19Z
dc.date.created2014-05-20T15:30:39Z
dc.date.issued2001-01-01
dc.identifierPolymer Degradation and Stability. Oxford: Elsevier B.V., v. 74, n. 1, p. 97-101, 2001.
dc.identifier0141-3910
dc.identifierhttp://hdl.handle.net/11449/39977
dc.identifier10.1016/S0141-3910(01)00106-9
dc.identifierWOS:000171263200010
dc.identifier8870539749821067
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/3911014
dc.description.abstractThe polymer surface degradation and/or modification evolution of Teflon FEP and Mylar C films caused by a low energy electron beam were analyzed using a new method that consists in measuring the second crossover energy shift in the electronic emission curve. Upon prolonged irradiation, the second crossover energy shifts irreversibly to lower values in Teflon FEP but to higher values in Mylar C, indicating distinct mechanisms of surface degradation for the two polymers. The method represents a relatively inexpensive way to monitor early stages of surface degradation since the secondary electron emission comes from a maximum depth below the geometric surface of 100 mn in insulators. (C) 2001 Elsevier B.V. Ltd. All rights reserved.
dc.languageeng
dc.publisherElsevier B.V.
dc.relationPolymer Degradation and Stability
dc.relation3.193
dc.relation1,041
dc.rightsAcesso restrito
dc.sourceWeb of Science
dc.subjectpolymer degradation
dc.subjectelectron beam irradiation
dc.subjectsecondary electrons
dc.titleUsing shifts in the electronic emission curve to evaluate polymer surface degradation
dc.typeArtigo


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