dc.contributorUniversidade Estadual Paulista (Unesp)
dc.contributorUniversidade Federal de São Carlos (UFSCar)
dc.date.accessioned2014-05-20T15:29:08Z
dc.date.accessioned2022-10-05T16:52:21Z
dc.date.available2014-05-20T15:29:08Z
dc.date.available2022-10-05T16:52:21Z
dc.date.created2014-05-20T15:29:08Z
dc.date.issued2005-01-01
dc.identifierCeramics International. Oxford: Elsevier B.V., v. 31, n. 3, p. 399-404, 2005.
dc.identifier0272-8842
dc.identifierhttp://hdl.handle.net/11449/38784
dc.identifier10.1016/j.ceramint.2004.06.004
dc.identifierWOS:000227603500007
dc.identifier9128353103083394
dc.identifier3892896473273324
dc.identifier0000-0001-7083-5626
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/3910037
dc.description.abstractTa2O5 doped SnO2 varistor systems containing 0.5 mol% ZnO and 0.5 mol% Coo were prepared by mixed oxide method. Considering that ZnO and Coo oxides are densification additives only the SnO(2)center dot ZnO center dot CoO ceramics cannot exhibit electrical nonlinearity. A small amount of Ta2O5 improves the nonlinear properties of the samples greatly. The height and width of the defect barriers were calculated. It was found that samples doped with 0.05 mol% Ta2O5 exhibit the highest density (98.5%), the lowest electric breakdown field (E-b = 1100 V/cm) and the highest coefficient of nonlinearity (alpha = 11.5). The effect of Ta2O5 dopant could be explained by the substitution of Ta5+ by Sn4+. A grain-boundary defect barrier model for the SnO(2)center dot ZnO center dot CoO center dot Ta2O5 varistor system was also introduced. (c) 2004 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
dc.languageeng
dc.publisherElsevier B.V.
dc.relationCeramics International
dc.relation3.057
dc.relation0,784
dc.rightsAcesso restrito
dc.sourceWeb of Science
dc.subjectvaristor
dc.subjecttin dioxide
dc.subjecttantalum oxide
dc.titleInvestigation of electrical properties of tantalum doped SnO2 varistor system
dc.typeArtigo


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