Influence of thickness on crystallization and properties of LiNbO3 thin films

dc.contributorUniversidade Estadual Paulista (Unesp)
dc.contributorUniversity of Belgrade
dc.date.accessioned2014-05-20T14:18:02Z
dc.date.accessioned2022-10-05T15:15:09Z
dc.date.available2014-05-20T14:18:02Z
dc.date.available2022-10-05T15:15:09Z
dc.date.created2014-05-20T14:18:02Z
dc.date.issued2003-03-01
dc.identifierMaterials Characterization. New York: Elsevier B.V., v. 50, n. 2-3, p. 239-244, 2003.
dc.identifier1044-5803
dc.identifierhttp://hdl.handle.net/11449/25423
dc.identifier10.1016/S1044-5803(03)00089-5
dc.identifierWOS:000186249900025
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/3898528
dc.description.abstractThin films of lithium niobate were deposited on Pt/Ti/SiO2 (111) substrates by spin coating from the polymeric precursor method (Pechini process). Annealing in static air was performed at 500 degreesC for 3 h. The obtained films were characterized by X-ray diffraction and atomic force microscopy. The dielectric constant, dissipation factor and resistance were measured in frequency region from 10 Hz to 10 MHz and the hysteresis loop was obtained. The influence of number of layers on crystallization, morphology and properties of LiNbO3 thin films is discussed. (C) 2003 Elsevier B.V. All rights reserved.
dc.languageeng
dc.publisherElsevier B.V.
dc.relationMaterials Characterization
dc.relation2.892
dc.relation1,291
dc.rightsAcesso restrito
dc.sourceWeb of Science
dc.subjectLiNbO3
dc.subjectcrystallization
dc.subjectelectrical properties
dc.titleInfluence of thickness on crystallization and properties of LiNbO3 thin films
dc.typeArtigo


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