LFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation

dc.creatorAcevedo Patiño, Óscar
dc.creatorKagaris D.
dc.date.accessioned2020-03-26T16:32:37Z
dc.date.available2020-03-26T16:32:37Z
dc.date.created2020-03-26T16:32:37Z
dc.date.issued2017
dc.identifierLATS 2017 - 18th IEEE Latin-American Test Symposium
dc.identifier9781538604151
dc.identifierhttps://hdl.handle.net/20.500.12585/8936
dc.identifier10.1109/LATW.2017.7906758
dc.identifierUniversidad Tecnológica de Bolívar
dc.identifierRepositorio UTB
dc.identifier57197327858
dc.identifier7004389110
dc.description.abstractIn built-in two-dimensional deterministic test pattern generation, a Linear Feedback Shift Register (LFSR) extended by phase shifters (PS) is commonly used for generating the test patterns. The specific LFSR/PS structure is currently chosen a-priori without regard to the actual test set. In this paper, we present a method to design the LFSR/PS structure based on the particular test set that we are given. Comparative experimental results show that the methodology can attain 100% coverage which cannot be achieved with current approaches. © 2017 IEEE.
dc.languageeng
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation13 March 2017 through 15 March 2017
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.rightsinfo:eu-repo/semantics/restrictedAccess
dc.rightsAtribución-NoComercial 4.0 Internacional
dc.sourcehttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85020214634&doi=10.1109%2fLATW.2017.7906758&partnerID=40&md5=786fd8d8ebbd541ded723bc37ccb1a54
dc.sourceScopus2-s2.0-85020214634
dc.source18th IEEE Latin-American Test Symposium, LATS 2017
dc.titleLFSR characteristic polynomial and phase shifter computation for two-dimensional test set generation


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