dc.creatorAltamar Mercado, Hernando
dc.creatorPatiño Vanegas, Alberto
dc.creatorMarrugo A.G.
dc.date.accessioned2020-03-26T16:32:35Z
dc.date.available2020-03-26T16:32:35Z
dc.date.created2020-03-26T16:32:35Z
dc.date.issued2018
dc.identifierOptics InfoBase Conference Papers; Vol. Part F95-3D 2018
dc.identifier9781557528209
dc.identifierhttps://hdl.handle.net/20.500.12585/8903
dc.identifier10.1364/3D.2018.JTu4A.19
dc.identifierUniversidad Tecnológica de Bolívar
dc.identifierRepositorio UTB
dc.identifier57203321995
dc.identifier57190688459
dc.identifier24329839300
dc.description.abstractIn this work we study the use of a focus measure to improve the 3D reconstruction of low reflectivity microscopic samples using white light interference microscopy. Simulation and experimental results show the improved reconstruction. © 2018 The Author(s).
dc.languageeng
dc.publisherOSA - The Optical Society
dc.relation25 June 2018 through 28 June 2018
dc.rightshttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.rightsinfo:eu-repo/semantics/restrictedAccess
dc.rightsAtribución-NoComercial 4.0 Internacional
dc.sourcehttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85051263259&doi=10.1364%2f3D.2018.JTu4A.19&partnerID=40&md5=4a022a8af3e8ac7c0cdb439cddfa34e4
dc.source3D Image Acquisition and Display: Technology, Perception and Applications, 3D 2018
dc.titleMicroscopic shape from focus using white light interferometric fringes


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