PSO for Minimizing Makespan of Non-Identical Parallel Batch Processing Machines

dc.contributorUniversidad EAFIT. Departamento de Ingeniería de Producción
dc.contributorGestión de Producción y Logística
dc.creatorDamodaran
dc.creatorPurushothaman
dc.creatorDiyadawagamage
dc.creatorDon Asanka
dc.creatorMario C. Vélez-Gallego
dc.date.accessioned2021-04-12T19:59:19Z
dc.date.accessioned2022-09-23T22:02:53Z
dc.date.available2021-04-12T19:59:19Z
dc.date.available2022-09-23T22:02:53Z
dc.date.created2021-04-12T19:59:19Z
dc.date.issued2011-05-25
dc.identifier9780983762409
dc.identifierhttp://hdl.handle.net/10784/28514
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/3538420
dc.description.abstractEnvironmental Stress Screening (ESS) chambers are commonly used to test Printed Circuit Boards (PCBs) to detect early failures before they are used in the field. This research is motivated by our interactions with an electronics manufacturer
dc.languageeng
dc.publisherInstitute of Industrial Engineers ( IIE )
dc.rightsInstitute of Industrial Engineers ( IIE )
dc.source61st Annual IIE Conference and Expo Proceedings
dc.subjectBatch processing machines
dc.subjectnon-identical machines
dc.subjectmakespan
dc.subjectParticle Swarm Optimization
dc.titlePSO for Minimizing Makespan of Non-Identical Parallel Batch Processing Machines
dc.typeinfo:eu-repo/semantics/bookPart
dc.typebookPart
dc.typeinfo:eu-repo/semantics/publishedVersion
dc.typepublishedVersion


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