Dielectric properties characterization of high dielectric constant thick films

dc.contributorUniversidad EAFIT. Departamento de Ciencias Básicas
dc.contributorÓptica Aplicada
dc.creatorDemenicis, Luciene S.
dc.creatorJ. I. Marulanda
dc.creatorLima, Rodolfo A. A.
dc.creatorCarvalho, Maria Cristina R.
dc.date.accessioned2021-04-12T14:17:31Z
dc.date.accessioned2022-09-23T22:00:24Z
dc.date.available2021-04-12T14:17:31Z
dc.date.available2022-09-23T22:00:24Z
dc.date.created2021-04-12T14:17:31Z
dc.date.issued2010-10-01
dc.identifier10982760
dc.identifier08952477
dc.identifierhttp://hdl.handle.net/10784/27934
dc.identifier10.1002/mop.25440
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/3537718
dc.description.abstractA technique for the characterization of microwave dielectric properties of high dielectric constant thick films at room temperature is proposed, using multilayered coplanar waveguide transmission lines with high dielectric constant thick films deposit
dc.languageeng
dc.publisherJohn Wiley & Sons
dc.relationhttps://onlinelibrary.wiley.com/doi/abs/10.1002/mop.25440
dc.rightshttps://v2.sherpa.ac.uk/id/publication/issn/1098-2760
dc.sourceMicrowave and Optical Technology Letters
dc.titleDielectric properties characterization of high dielectric constant thick films
dc.typeinfo:eu-repo/semantics/article
dc.typearticle
dc.typeinfo:eu-repo/semantics/publishedVersion
dc.typepublishedVersion


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