Parameter estimation for ridge detection in images with thin structures.

dc.contributorLUCIO ANDRE DE CASTRO JORGE, CNPDIA.
dc.creatorPERCIANO, T.
dc.creatorHIRATA JUNIOR, R.
dc.creatorJORGE, L. A. de C.
dc.date.accessioned2011-04-10T11:11:11Z
dc.date.available2011-04-10T11:11:11Z
dc.date.created2011-04-10T11:11:11Z
dc.date.issued2010
dc.identifierIn: BLOCH, I.; CESAR JUNIOR, R. M. (Ed.). Progress in pattern recognition, image analysis, computer vision and applications. Heidelberg: Springer, 2010. p. 386-393. Originalmente apresentado como 15 Iberoamerican Congress on Pattern Recognition - CIARP, 2010, São Paulo, SP. Proceedings...
dc.identifierhttp://www.alice.cnptia.embrapa.br/alice/handle/doc/882928
dc.languageeng
dc.rightsopenAccess
dc.subjectEvento
dc.titleParameter estimation for ridge detection in images with thin structures.
dc.typeArtículos de revistas


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