Structural complexity of disordered surfaces: analyzing the porous silicon SFM patterns

dc.creatorRosa, R. R.
dc.creatorBaroni, M. P. M. A.
dc.creatorZaniboni, G. T.
dc.creatorSilva, A. Ferreira da
dc.creatorRoman, L. S.
dc.creatorPontes, J.
dc.creatorBolzan, M. J. A.
dc.date.accessioned2019-05-22T15:39:34Z
dc.date.available2019-05-22T15:39:34Z
dc.date.issued2007
dc.identifierhttp://repositorio.ufba.br/ri/handle/ri/14664
dc.identifierv. 386, n. 2
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/2708831
dc.description.abstract
dc.languageen
dc.rightsrestrito
dc.sourcehttp://dx.doi.org/10.1016/j.physa.2007.08.044
dc.subjectDisordered surfaces
dc.subjectStructural complexity
dc.subjectGradient pattern analysis
dc.subjectWavelet multiresolution analysis
dc.subjectEuler characteristic
dc.subjectKPZ equation
dc.subjectPorous silicon
dc.titleStructural complexity of disordered surfaces: analyzing the porous silicon SFM patterns
dc.typeArtigo de Peri??dico


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