dc.creatorCastilho, Caio M??rio Castro de
dc.date.accessioned2013-10-15T15:20:04Z
dc.date.accessioned2019-05-22T15:35:50Z
dc.date.available2013-10-15T15:20:04Z
dc.date.available2019-05-22T15:35:50Z
dc.date.created2013-10-15T15:20:04Z
dc.date.issued1999
dc.identifier0022-3727
dc.identifierhttp://www.repositorio.ufba.br/ri/handle/ri/13234
dc.identifierv. 32, n. 17
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/2707276
dc.description.abstract
dc.languageen
dc.publisherJournal of Physics D: Applied Physics
dc.source10.1088/0022-3727/32/17/317
dc.titleIon trajectories in atom probe field ion microscopy and gas field ion sources
dc.typeArtigo de Peri??dico


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