dc.contributorUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2018-12-11T16:40:10Z
dc.date.available2018-12-11T16:40:10Z
dc.date.created2018-12-11T16:40:10Z
dc.date.issued2016-01-01
dc.identifierComputers and Industrial Engineering, v. 91, p. 205-214.
dc.identifier0360-8352
dc.identifierhttp://hdl.handle.net/11449/168193
dc.identifier10.1016/j.cie.2015.10.011
dc.identifier2-s2.0-84949579960
dc.identifier2-s2.0-84949579960.pdf
dc.description.abstractIn independent investigations, the variable sample size (VSS) scheme and the side-sensitive synthetic (SS) rule proved to reduce the delay with which the X¯ chart signals. Based on these findings we investigate the X¯ chart's performance with the joint use of the VSS scheme and the side-sensitive synthetic rule. The SSVSS X¯ chart outperforms the pure VSS X¯ chart, especially when the risk of false alarms and the rate of inspected items per sampling cannot be high. In these cases, the VSS X¯ chart detects moderate mean shifts (around one standard deviation) in half of the time thanks to the side-sensitive synthetic rule.
dc.languageeng
dc.relationComputers and Industrial Engineering
dc.relation1,463
dc.rightsAcesso aberto
dc.sourceScopus
dc.subjectQuality control
dc.subjectSide-sensitive
dc.subjectSynthetic
dc.subjectVSS
dc.subjectX¯ chart
dc.titleA side-sensitive synthetic chart combined with a VSS X¯ chart
dc.typeArtículos de revistas


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