Actas de congresos
Interferometric measurements of nanometric displacements in a Piezoelectric Flextensional Actuator by using the new J1...J5 method
Fecha
2012-12-01Registro en:
2012 10th IEEE/ias International Conference on Industry Applications (induscon). New York: IEEE, p. 6, 2012.
10.1109/INDUSCON.2012.6452451
WOS:000318021500043
2-s2.0-84874438910
2883440351895167
6405339510883203
0000-0003-4201-5617
0000-0001-6320-755X
Autor
Universidade Estadual Paulista (Unesp)
Universidade de São Paulo (USP)
Institución
Resumen
In this work, nanometric displacement amplitudes of a Piezoelectric Flextensional Actuator (PFA) designed using the topology optimization technique and operating in its linear range are measured by using a homodyne Michelson interferometer. A new improved version of the J1...J4 method for optical phase measurements, named J1...J5 method, is presented, which is of easier implementation than the original one. This is a passive phase detection scheme, unaffected by signal fading, source instabilities and changes in visibility. Experimental results using this improvement were compared with those obtained by using the J1... J4, J1...J6(pos) and J1...J 6(neg) methods, concluding that the dynamic range is increased while maintaining the sensitivity. Analysis based on the 1/f voltage noise and random fading show the new method is more stable to phase drift than all those methods. © 2012 IEEE.