dc.contributorSCampus Itabira
dc.contributorUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-27T11:25:21Z
dc.date.available2014-05-27T11:25:21Z
dc.date.created2014-05-27T11:25:21Z
dc.date.issued2010-12-01
dc.identifierJournal of Advanced Microscopy Research, v. 5, n. 3, p. 223-231, 2010.
dc.identifier2156-7573
dc.identifier2156-7581
dc.identifierhttp://hdl.handle.net/11449/72069
dc.identifier10.1166/jamr.2010.1046
dc.identifier2-s2.0-84867518058
dc.description.abstractDielectric spectroscopy was used in this study to examine polycrystalline vanadium and tungstendoped BaZr 0.1Ti 0.90O 3 (BZT10:2V and BZT10:2W) ceramics obtained by the mixed oxide method. According to X-ray diffraction analyses, addition of vanadium and tungsten lead to ceramics free of secondary phases. SEM analyses reveal that both dopants result in slower oxygen ion motion and consequently lower grain growth rate. Temperature dependence dielectric study showed normal ferroelectric to paraelectric transition well above the room temperature for the BZT10 and BZT10:2V ceramics. However, BZT10:2W ceramic showed a relaxor-like behavior near phase transition characterized by the empirical parameter γ. Piezoelectric force microscopy images reveals that the piezoelectric coefficient is strongly influenced by type of donor dopant suggesting promising applications for dynamic random access memories and data-storage media. Copyright © 2010 American Scientific Publishers All rights reserved.
dc.languageeng
dc.relationJournal of Advanced Microscopy Research
dc.relation0,133
dc.relation0,133
dc.rightsAcesso restrito
dc.sourceScopus
dc.subjectCeramics
dc.subjectDieletric response
dc.subjectDopants
dc.subjectMixed oxide
dc.subjectPiezoelectricity
dc.subjectDielectric analysis
dc.subjectDielectric studies
dc.subjectDonor dopants
dc.subjectDynamic random access memory
dc.subjectEmpirical parameters
dc.subjectIon motions
dc.subjectMixed oxide method
dc.subjectParaelectric transitions
dc.subjectPiezoelectric coefficient
dc.subjectPiezoelectric force microscopy
dc.subjectPolycrystalline
dc.subjectRoom temperature
dc.subjectSecondary phasis
dc.subjectSEM analysis
dc.subjectTemperature dependence
dc.subjectZirconium titanate
dc.subjectBarium
dc.subjectCrystallography
dc.subjectDigital storage
dc.subjectDoping (additives)
dc.subjectFerroelectric ceramics
dc.subjectGrain growth
dc.subjectTungsten
dc.subjectVanadium
dc.subjectX ray diffraction
dc.subjectX ray diffraction analysis
dc.subjectZirconium
dc.subjectCeramic materials
dc.titleMicroscopic and dielectric analyses of vanadium and tungsten modified barium zirconium titanate ceramics
dc.typeArtículos de revistas


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