Actas de congresos
Preliminary results concerning the VSS X- chart with unknow in-control parameters
IEEM2010 - IEEE International Conference on Industrial Engineering and Engineering Management, p. 1421-1424.
IRCCyN UMR CNRS 6597 and Université de Nantes
IRCCyN UMR CNRS 6597 and Ecole Centrale de Nantes
Universidade Estadual Paulista (UNESP)
University of the Aegean
The VSS X- chart is known to perform better than the traditional X- control chart in detecting small to moderate mean shifts in the process. Many researchers have used this chart in order to detect a process mean shift under the assumption of known parameters. However, in practice, the process parameters are rarely known and are usually estimated from an in-control Phase I data set. In this paper, we evaluate the (run length) performances of the VSS X- control chart when the process parameters are estimated and we compare them in the case where the process parameters are assumed known. We draw the conclusion that these performances are quite different when the shift and the number of samples used during the phase I are small. ©2010 IEEE.
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