Construction and test of low cost X-ray tomography scanner for physical-chemical analysis and nondestructive inspections

dc.contributorUniversidade de Sorocaba - UNISO
dc.contributorUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-27T11:24:02Z
dc.date.available2014-05-27T11:24:02Z
dc.date.created2014-05-27T11:24:02Z
dc.date.issued2009-11-27
dc.identifierAIP Conference Proceedings, v. 1139, p. 102-105.
dc.identifier0094-243X
dc.identifier1551-7616
dc.identifierhttp://hdl.handle.net/11449/71250
dc.identifier10.1063/1.3157786
dc.identifier2-s2.0-70450214020
dc.identifier2-s2.0-70450214020.pdf
dc.description.abstractX-ray computed tomography (CT) refers to the cross-sectional imaging of an object measuring the transmitted radiation at different directions. In this work, we describe the development of a low cost micro-CT X-ray scanner that is being developed for nondestructive testing. This tomograph operates using a microfocus X-ray source and contains a silicon photodiode as detectors. The performance of the system, by its spatial resolution, has been estimated through its Modulation Transfer Function - MTF and the obtained value at 10% of MTF is 661 μm. It was built as a general purpose nondestructive testing device. © 2009 American Institute of Physics.
dc.languageeng
dc.relationAIP Conference Proceedings
dc.rightsAcesso aberto
dc.sourceScopus
dc.subjectImage analysis
dc.subjectNondestructive inspections
dc.subjectTomography
dc.subjectX-ray
dc.titleConstruction and test of low cost X-ray tomography scanner for physical-chemical analysis and nondestructive inspections
dc.typeActas de congresos


Este ítem pertenece a la siguiente institución