Structural phase evolution of strontium-doped lead titanate thin films prepared by the soft chemical technique

dc.contributorUniversidade Federal de São Carlos (UFSCar)
dc.contributorUniversidade Federal do Piauí (UFPI)
dc.contributorUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-27T11:20:37Z
dc.date.available2014-05-27T11:20:37Z
dc.date.created2014-05-27T11:20:37Z
dc.date.issued2003-03-01
dc.identifierJournal of Materials Research, v. 18, n. 3, p. 659-663, 2003.
dc.identifier0884-2914
dc.identifierhttp://hdl.handle.net/11449/67212
dc.identifier10.1557/JMR.2003.0087
dc.identifierWOS:000181411200019
dc.identifier2-s2.0-0038676283
dc.identifier2-s2.0-0038676283.pdf
dc.description.abstractStrontium-modified lead titanate thin films with composition Pb1-xSrxTiO3 were grown on Pt/Ti/SiO2/Si substrates using the polymeric precursor method. The structural phase evolution as a function of the Sr contents was studied using micro-Raman scattering, specular reflectance infrared Fourier transform spectroscopy, and x-ray diffraction. The results showed a gradual change from tetragonal to cubic structure, the transition occurring at about x = 0.58. The infrared reflectance spectra showed that the frequency of several peaks decreases as the strontium concentration increases. These features are correlated with a decrease in the tetragonal distortion of the TiO6 octahedra as the strontium concentration increases.
dc.languageeng
dc.relationJournal of Materials Research
dc.relation1.495
dc.relation0,610
dc.rightsAcesso restrito
dc.sourceScopus
dc.subjectDoping (additives)
dc.subjectFourier transform infrared spectroscopy
dc.subjectLead compounds
dc.subjectRaman scattering
dc.subjectStrontium
dc.subjectX ray diffraction analysis
dc.subjectSoft chemical techniques
dc.subjectThin films
dc.titleStructural phase evolution of strontium-doped lead titanate thin films prepared by the soft chemical technique
dc.typeArtículos de revistas


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