Accuracy assessment of a photogrammetric close-range reconstruction system

dc.contributorUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T15:29:03Z
dc.date.available2014-05-20T15:29:03Z
dc.date.created2014-05-20T15:29:03Z
dc.date.issued1998-01-01
dc.identifierSibgrapi '98 - International Symposium on Computer Graphics, Image Processing, and Vision, Proceedings. Los Alamitos: IEEE Computer Soc, p. 46-53, 1998.
dc.identifierhttp://hdl.handle.net/11449/38731
dc.identifier10.1109/SIBGRA.1998.722732
dc.identifierWOS:000076805000008
dc.description.abstractGeometric accuracy of a close-range photogrammetric system is assessed in this paper considering surface reconstruction with structured light as its main purpose. The system is based on an off-the-shelf digital camera and a pattern projector. The mathematical model for reconstruction is based on the parametric equation of the projected straight line combined with collinearity equations. A sequential approach for system calibration was developed and is presented. Results obtained from real data are also presented and discussed. Experiments with real data using a prototype have indicated 0.5mm of accuracy in height determination and 0.2mm in the XY plane considering an application where the object was 1630mm distant from the camera.
dc.languageeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE), Computer Soc
dc.relationSibgrapi '98 - International Symposium on Computer Graphics, Image Processing, and Vision, Proceedings
dc.rightsAcesso aberto
dc.sourceWeb of Science
dc.subjectreconstruction
dc.subjectcalibration
dc.subjectclose-range photogrammetry
dc.titleAccuracy assessment of a photogrammetric close-range reconstruction system
dc.typeActas de congresos


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