dc.contributorUniversidade Federal de São Carlos (UFSCar)
dc.contributorUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T15:25:54Z
dc.date.available2014-05-20T15:25:54Z
dc.date.created2014-05-20T15:25:54Z
dc.date.issued2006-01-01
dc.identifierFerroelectrics. Abingdon: Taylor & Francis Ltd, v. 335, p. 211-218, 2006.
dc.identifier0015-0193
dc.identifierhttp://hdl.handle.net/11449/36218
dc.identifier10.1080/00150190600691387
dc.identifierWOS:000239567200025
dc.description.abstractPbZr0.3Ti0.7O3 (PZT) films were produced by polymeric precursor route and deposited by spin-coater technique on Pt(111)/Ti/SiO2/Si(100) substrates. The films were heat-treated using different furnaces: (a) a conventional furnace, at 700 degrees C; and (b) a domestic microwave oven, at 600 degrees C. The X-ray patterns revealed that both films are single phase and reflections were identified as belongs to the PZT phase. The intensity of these reflections showed a (111), (001) and (100) preferred orientation. Morphological and electrical characterizations showed that all samples present a rather different microstructure and both with high spontaneous polarization.
dc.languageeng
dc.publisherTaylor & Francis Ltd
dc.relationFerroelectrics
dc.relation0.728
dc.relation0,260
dc.rightsAcesso restrito
dc.sourceWeb of Science
dc.subjectferroelectric
dc.subjectfilm
dc.subjectpolymeric precursor route
dc.subjectPZT
dc.subjectmicrowave oven
dc.titleTextured PbZr0.3Ti0.7O3 thin films produced by polymeric precursor method using microwave oven
dc.typeArtículos de revistas


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