Artículos de revistas
Morphology of alumina: a comparison between infrared spectroscopy and X-ray diffractometry
Fecha
1999-05-01Registro en:
Journal of Non-crystalline Solids. Amsterdam: Elsevier B.V., v. 247, p. 227-231, 1999.
0022-3093
10.1016/S0022-3093(99)00075-7
WOS:000080506900040
4284809342546287
2115942621694174
Autor
Universidade Estadual Paulista (Unesp)
Institución
Resumen
Morphology of three samples of alumina are investigated. Infrared spectra are analysed by use of their morphology through the theory of average dielectric constant. Crystal shape is obtained from X-ray diffraction patterns by reflection intensity ratio. In the case of electron scanning microscopy, shape factor was obtained by an average axial ratio of the particles. Comparison of results show that there is agreement among these techniques and infrared spectra can be used to determine the morphology of alumina particles from 2.7 to 10 mu m, even for heterogeneous samples. (C) 1999 Elsevier B.V. B.V. All rights reserved.