dc.contributorUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T13:28:32Z
dc.date.available2014-05-20T13:28:32Z
dc.date.created2014-05-20T13:28:32Z
dc.date.issued2008-11-01
dc.identifierInternational Journal of Advanced Manufacturing Technology. Artington: Springer London Ltd, v. 39, n. 5-6, p. 521-542, 2008.
dc.identifier0268-3768
dc.identifierhttp://hdl.handle.net/11449/9504
dc.identifier10.1007/s00170-007-1230-6
dc.identifierWOS:000259864800011
dc.description.abstractIn this paper, we consider the double sampling (DS) (X) over bar control chart for monitoring processes in which the observations can be represented as a first-order autoregressive moving average (ARMA(1, 1)) model. The properties of the DS (X) over bar control chart with the sampling intervals driven by the rational subgroup concept are studied and compared with the Shewhart chart and the variable sample size (VSS) chart, both properly modified to account for the serial correlation. Numerical results show that the correlation within subgroups has a significant impact on the properties of the charts. For processes with low to moderate correlation levels, the DS (X) over bar chart is substantially more efficient in detecting process mean shifts.
dc.languageeng
dc.publisherSpringer London Ltd
dc.relationInternational Journal of Advanced Manufacturing Technology
dc.relation2.601
dc.relation0,994
dc.rightsAcesso restrito
dc.sourceWeb of Science
dc.subjectautocorrelation
dc.subjectaverage run length
dc.subjectcontrol chart
dc.subjectdouble sampling
dc.subjectfirst-order autoregressive moving average process
dc.subjectstatistical process control
dc.titleDouble sampling (x)over-bar control chart for a first-order autoregressive moving average process model
dc.typeArtículos de revistas


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