Artículos de revistas
Direct Observation of Tetragonal Distortion in Epitaxial Structures through Secondary Peak Split in a Synchrotron Radiation Renninger Scan
Fecha
2010-08-01Registro en:
Crystal Growth & Design. Washington: Amer Chemical Soc, v. 10, n. 8, p. 3436-3441, 2010.
1528-7483
10.1021/cg100146x
WOS:000280471700024
Autor
Universidade Federal do Maranhão (UFMA)
Universidade Estadual de Campinas (UNICAMP)
Universidade Federal de Sergipe (UFS)
Universidade Estadual Paulista (Unesp)
Universidade de São Paulo (USP)
Institución
Resumen
This paper reports a direct observation of an interesting split of the (022)(022) four-beam secondary peak into two (022) and (022) three-beam peaks, in a synchrotron radiation Renninger scan (phi-scan), as an evidence of the layer tetragonal distortion in two InGaP/GaAs (001) epitaxial structures with different thicknesses. The thickness, composition, (a perpendicular to) perpendicular lattice parameter, and (01) in-plane lattice parameter of the two epitaxial ternary layers were obtained from rocking curves (omega-scan) as well as from the simulation of the (022)(022) split, and then, it allowed for the determination of the perpendicular and parallel (in-plane) strains. Furthermore, (022)(022) omega:phi mappings were measured in order to exhibit the multiple diffraction condition of this four-beam case with their split measurement.