info:eu-repo/semantics/article
Stretching single atom contacts at multiple subatomic step-length
Fecha
2013-03Registro en:
Wei, Yi Min; Liang, Jing Hong; Chen, Zhao Bin; Zhou, Xiao Shun; Mao, Bing Wei; et al.; Stretching single atom contacts at multiple subatomic step-length; Royal Society of Chemistry; Physical Chemistry Chemical Physics; 15; 30; 3-2013; 12459-12465
1463-9076
CONICET Digital
CONICET
Autor
Wei, Yi Min
Liang, Jing Hong
Chen, Zhao Bin
Zhou, Xiao Shun
Mao, Bing Wei
Oviedo, Oscar Alejandro
Leiva, Ezequiel Pedro M.
Resumen
This work describes jump-to-contact STM-break junction experiments leading to novel statistical distribution of last-step length associated with conductance of a single atom contact. Last-step length histograms are observed with up to five for Fe and three for Cu peaks at integral multiples close to 0.075 nm, a subatomic distance. A model is proposed in terms of gliding from a fcc hollow-site to a hcp hollow-site of adjacent atomic planes at 1/3 regular layer spacing along with tip stretching to account for the multiple subatomic step-length behavior.