Photothermal Microscopy

dc.creatorZaldivar Escola, Facundo
dc.creatorKunik, Dario
dc.creatorMartínez, Oscar Eduardo
dc.creatorMingolo, Nelida
dc.date.accessioned2018-08-21T14:47:47Z
dc.date.accessioned2018-11-06T12:29:15Z
dc.date.available2018-08-21T14:47:47Z
dc.date.available2018-11-06T12:29:15Z
dc.date.created2018-08-21T14:47:47Z
dc.date.issued2015-07
dc.identifierZaldivar Escola, Facundo; Kunik, Dario; Martínez, Oscar Eduardo; Mingolo, Nelida; Photothermal Microscopy; Elsevier; Procedia Materials Science; 8; 7-2015; 665-673
dc.identifier2211-8128
dc.identifierhttp://hdl.handle.net/11336/56307
dc.identifierCONICET Digital
dc.identifierCONICET
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1867192
dc.description.abstractAn accessory for a commercial optical microscope was implemented to map the thermal diffusivity of the sample with high spatial resolution. The system is based in the photothermal technique recently developed by the group. It consists in the measurement with a probe laser of the surface curvature induced by the heat delivered by a modulated pump laser. A lock-in detection technique provides the signal amplitude and phase asa function of the modulation frequency. The accessory was mounted on the camera port of a metallographic microscope Olympus BX51. Results obtained on different samples are presented.
dc.languageeng
dc.publisherElsevier
dc.relationinfo:eu-repo/semantics/altIdentifier/doi/https://dx.doi.org/10.1016/j.mspro.2015.04.123
dc.relationinfo:eu-repo/semantics/altIdentifier/url/https://www.sciencedirect.com/science/article/pii/S2211812815001248
dc.rightshttps://creativecommons.org/licenses/by-nc-sa/2.5/ar/
dc.rightsinfo:eu-repo/semantics/restrictedAccess
dc.subjectPhotothermal
dc.subjectMicroscope
dc.subjectconfocal
dc.subjectsurfaces
dc.titlePhotothermal Microscopy
dc.typeArtículos de revistas
dc.typeArtículos de revistas
dc.typeArtículos de revistas


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