Artículos de revistas
High-frequency Digital Lock-in Amplifier Using Random Sampling
Fecha
2008-12Registro en:
Sonnaillon, Maximiliano Osvaldo; Urteaga, Raul; Bonetto, Fabian Jose; High-frequency Digital Lock-in Amplifier Using Random Sampling; Institute of Electrical and Electronics Engineers; Ieee Transactions On Instrumentation And Measurement; 57; 3; 12-2008; 616-621
0018-9456
CONICET Digital
CONICET
Autor
Sonnaillon, Maximiliano Osvaldo
Urteaga, Raul
Bonetto, Fabian Jose
Resumen
A high-frequency digital lock-in amplifier (LIA) that uses a random-sampling scheme is proposed and tested experimentally in this paper. By using this sampling strategy, it is possible to process, without aliasing effects, periodic signals of frequencies that are several times higher than the Nyquist frequency. Analytical and numerical analyses that show the advantages and limitations of the proposed scheme are presented. A high-frequency digital LIA implementation is also described. The prototype maximum sampling frequency is 150 kHz, and its maximum signal frequency without aliasing is 2.5 MHz, limited only by the random-sampling period quantization. Experimental results that validate the proposal are presented.