dc.creatorMiguez, M. L.
dc.creatorBarbano, E. C.
dc.creatorZilio, Sérgio Carlos
dc.creatorMisoguti, Lino
dc.date.accessioned2016-06-27T19:35:26Z
dc.date.accessioned2018-07-04T17:08:55Z
dc.date.available2016-06-27T19:35:26Z
dc.date.available2018-07-04T17:08:55Z
dc.date.created2016-06-27T19:35:26Z
dc.date.issued2014
dc.identifierOptics Express,Washington, DC : Optical Society of America - OSA,v. 22, n. 21, p. 25530-25538, Oct. 2014
dc.identifierhttp://www.producao.usp.br/handle/BDPI/50372
dc.identifier10.1364/OE.22.025530
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1645305
dc.description.abstractWe report on the accurate measurement of nonlinear ellipse rotation (NER) by means of a phase-sensitive method employing a dual-phase lock-in. The magnitudes and signs of pure refractive electronic nonlinearities of silica and BK7 were determined with this new method using 150 femtosecond (fs) laser pulses at 775 nm. Experimental and theoretical analyses of the NER signal were carried out and the results were compared to those obtained with the Z-scan technique.
dc.languageeng
dc.publisherOptical Society of America - OSA
dc.publisherWashington, DC
dc.relationOptics Express
dc.rightsCopyright Optical Society of America - OSA
dc.rightsrestrictedAccess
dc.subjectNonlinear optics
dc.subjectOptical nonlinearities of condensed matter
dc.subjectUltrafast nonlinear optics
dc.titleAccurate measurement of nonlinear ellipse rotation using a phase-sensitive method
dc.typeArtículos de revistas


Este ítem pertenece a la siguiente institución