The log-Weibull-negative-binomial regression model under latent failure causes and presence of randomized activation schemes

dc.creatorLouzada, Francisco
dc.creatorCancho, Vicente Garibay
dc.creatorYiqi, Bao
dc.date.accessioned2016-03-07T16:38:11Z
dc.date.accessioned2018-07-04T17:07:51Z
dc.date.available2016-03-07T16:38:11Z
dc.date.available2018-07-04T17:07:51Z
dc.date.created2016-03-07T16:38:11Z
dc.date.issued2015
dc.identifierStatistics,Philadelphia : Taylor and Francis,v. 49, n. 4, 930-949, Ago. 2015
dc.identifierhttp://www.producao.usp.br/handle/BDPI/49827
dc.identifier10.1080/02331888.2014.925900
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1645058
dc.languageeng
dc.publisherTaylor and Francis
dc.publisherPhiladelphia
dc.relationStatistics
dc.rightsrestrictedAccess
dc.titleThe log-Weibull-negative-binomial regression model under latent failure causes and presence of randomized activation schemes
dc.typeArtículos de revistas


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