dc.creatorNascimento, Eduardo do
dc.creatorVanin, Vito Roberto
dc.creatorMaidana, Nora Lia
dc.creatorSilva, Tiago Fiorini da
dc.creatorRizzutto, Marcia de Almeida
dc.creatorVarea, José María Fernández
dc.date.accessioned2014-04-28T18:59:21Z
dc.date.accessioned2018-07-04T16:45:06Z
dc.date.available2014-04-28T18:59:21Z
dc.date.available2018-07-04T16:45:06Z
dc.date.created2014-04-28T18:59:21Z
dc.date.issued2012-09-02
dc.identifierBrazilian Workshop on Nuclear Physics, XXXV, 2012, São Sebastião.
dc.identifier978-0-7354-1154-8
dc.identifierhttp://www.producao.usp.br/handle/BDPI/44685
dc.identifierhttp://dx.doi.org/10.1063/1.4804096
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1639866
dc.description.abstractDoppler Broadening Spectroscopy of the large Ge crystal of an HPGe detector was perforrned using positrons from pair production of 6.13 MeV ϒ-rays from the 19F(p,αϒ) 16O reaction. Two HPGe detectors facing opposite sides of the Ge crystal acting as target provided both coincidence and singles spectra. Changes in the shape of the annihilation peak were observed when the high voltage applied to the target detector was switched on or off, amounting to somewhat less than 20% when the areas of equivalent energy intervals in the corresponding normalized spectra are compared.
dc.languageeng
dc.publisherSão Sebastião
dc.relationBrazilian Workshop on Nuclear Physics, XXXV
dc.rightsEduardo do Nascimento
dc.rightsrestrictedAccess
dc.subjectPositron annihilation
dc.subjectHPGe detector
dc.subjectCoincidence Doppler broadening spectrum
dc.titlePositron annihilation spectroscopy techniques applied to the study of an HPGe detector.
dc.typeActas de congresos


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