dc.creatorCARVALHO, Hudson W. P. de
dc.creatorBATISTA, Ana P. L.
dc.creatorRAMALHO, Teodorico C.
dc.creatorPEREZ, Carlos A.
dc.creatorGOBBI, Angelo Luiz
dc.date.accessioned2012-10-20T05:28:12Z
dc.date.accessioned2018-07-04T15:50:34Z
dc.date.available2012-10-20T05:28:12Z
dc.date.available2018-07-04T15:50:34Z
dc.date.created2012-10-20T05:28:12Z
dc.date.issued2009
dc.identifierSPECTROCHIMICA ACTA PART A-MOLECULAR AND BIOMOLECULAR SPECTROSCOPY, v.74, n.1, p.292-296, 2009
dc.identifier1386-1425
dc.identifierhttp://producao.usp.br/handle/BDPI/31505
dc.identifier10.1016/j.saa.2009.06.021
dc.identifierhttp://dx.doi.org/10.1016/j.saa.2009.06.021
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1628143
dc.description.abstractIn order to evaluate the interactions between Au/Cu atoms and clean Si(l 11) surface, we used synchrotron radiation grazing incidence X-ray fluorescence analysis and theoretical calculations. Optimized geometries and energies on different adsorption sites indicate that the binding energies at different adsorption sites are high, suggesting a strong interaction between metal atom and silicon surface. The Au atom showed higher interaction than Cu atom. The theoretical and experimental data showed good agreement. Crown Copyright (C) 2009 Published by Elsevier B.V. All rights reserved.
dc.languageeng
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.relationSpectrochimica Acta Part A-molecular and Biomolecular Spectroscopy
dc.rightsCopyright PERGAMON-ELSEVIER SCIENCE LTD
dc.rightsrestrictedAccess
dc.subjectTotal X-ray reflection
dc.subjectGrazing incidence X-ray fluorescence (GIXRF) analysis
dc.subjectSemiconductor surface
dc.titleThe interaction between atoms of Au and Cu with clean Si(111) surface: A study combining synchrotron radiation grazing incidence X-ray fluorescence analysis and theoretical calculations
dc.typeArtículos de revistas


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