dc.creatorJESUS, F. A. A. de
dc.creatorANDREETA, Marcello Rubens Barsi
dc.creatorHERNANDES, Antonio Carlos
dc.creatorMACEDO, Z. S.
dc.date.accessioned2012-10-20T04:18:57Z
dc.date.accessioned2018-07-04T15:42:49Z
dc.date.available2012-10-20T04:18:57Z
dc.date.available2018-07-04T15:42:49Z
dc.date.created2012-10-20T04:18:57Z
dc.date.issued2010
dc.identifierOPTICAL MATERIALS, v.32, n.10, p.1286-1290, 2010
dc.identifier0925-3467
dc.identifierhttp://producao.usp.br/handle/BDPI/29869
dc.identifier10.1016/j.optmat.2010.05.004
dc.identifierhttp://dx.doi.org/10.1016/j.optmat.2010.05.004
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1626509
dc.description.abstractBismuth germanate films were prepared by dip coating and spin coating techniques and the dependence of the luminescent properties of the samples on the resin viscosity and deposition technique was investigated. The resin used for the preparation of the films was obtained via Pechini method, employing the precursors Bi(2)O(3) and GeO(2). Citric acid and ethylene glycol were used as chelating and cross-linking agents, respectively. Results from X-ray diffraction and Raman spectroscopy indicated that the films sintered at 700 degrees C for 10 h presented the single crystalline phase Bi(4)Ge(3)O(12). SEM images of the films have shown that homogeneous flat films can be produced by the two techniques investigated. All the samples presented the typical Bi(4)Ge(3)O(12) emission band centred at 505 nm. Films with 3.1 mu m average thickness presented 80% of the luminescence intensity registered for the single crystal at the maximum wavelength. Published by Elsevier B.V.
dc.languageeng
dc.publisherELSEVIER SCIENCE BV
dc.relationOptical Materials
dc.rightsCopyright ELSEVIER SCIENCE BV
dc.rightsrestrictedAccess
dc.subjectBGO
dc.subjectPhotoluminescence
dc.subjectRaman
dc.subjectPechini
dc.subjectFilm
dc.titleBismuth germanate films prepared by Pechini method
dc.typeArtículos de revistas


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