dc.creatorGOMEZ, A.
dc.creatorLIMA, N. B.
dc.creatorTENORIO, J. A.
dc.date.accessioned2012-10-19T01:43:54Z
dc.date.accessioned2018-07-04T14:50:27Z
dc.date.available2012-10-19T01:43:54Z
dc.date.available2018-07-04T14:50:27Z
dc.date.created2012-10-19T01:43:54Z
dc.date.issued2008
dc.identifierMATERIALS TRANSACTIONS, v.49, n.4, p.728-732, 2008
dc.identifier1345-9678
dc.identifierhttp://producao.usp.br/handle/BDPI/18376
dc.identifier10.2320/matertrans.MRA2007129
dc.identifierhttp://dx.doi.org/10.2320/matertrans.MRA2007129
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1615171
dc.description.abstractAluminum white dross is a valuable material principally due to its high metallic aluminum content. The aim of this work is to develop a method for quantitative analysis of aluminum white dross with high accuracy. Initially, the material was separated into four granulometric fractions by means of screening. Two samples of each fraction were obtained, which were analyzed by means of X-ray fluorescence and energy dispersive spectroscopy in order to determine the elements present in the samples. The crystalline phases aluminum, corundum, spinel, defect spinel, diaoyudaoite, aluminum nitride, silicon and quartz low were identified by X-ray diffraction. The quantitative phase analysis was performed by fitting the X-ray diffraction profile with the Rietveld method using the GSAS software. The following quantitative results were found: 77.8% aluminum, 7.3% corundum, 2.6% spinel, 7.6% defect spinel, 1.8% diaoyudaoite, 2.9% aluminum nitride, and values not significant of quartz and silicon.
dc.languageeng
dc.publisherJAPAN INST METALS
dc.relationMaterials Transactions
dc.rightsCopyright JAPAN INST METALS
dc.rightsrestrictedAccess
dc.subjectX-ray diffraction
dc.subjectRietveld method
dc.subjectquantitative characterization
dc.subjectaluminum dross
dc.titleQuantitative analysis of aluminum dross by the Rietveld method
dc.typeArtículos de revistas


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