dc.creatorUssami
dc.creatorThais Harumi; Martins
dc.creatorEliane; Montecchi
dc.creatorLeonardo
dc.date2016
dc.date2017-11-13T13:50:41Z
dc.date2017-11-13T13:50:41Z
dc.date.accessioned2018-03-29T06:07:12Z
dc.date.available2018-03-29T06:07:12Z
dc.identifier978-1-4673-8891-7
dc.identifier2016 46th Annual Ieee/ifip International Conference On Dependable Systems And Networks Workshops (dsn-w). Ieee, p. 39 - 46, 2016.
dc.identifierWOS:000386564300008
dc.identifier10.1109/DSN-W.2016.22
dc.identifierhttp://ieeexplore.ieee.org/abstract/document/7575347/
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/329241
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1366266
dc.descriptionAgile software development methodologies use an iterative and incremental development in order to handle evolving systems. Consolidated techniques in the field of testing have been applied to these techniques with the main purpose of aiding in the test creation stage. An example is Model-Based Test Driven Development (MBTDD) which joins the concepts of Model-Based Testing (MBT) and Test Driven Development (TDD). However, when iterative and incremental processes are used, problems appear as the consequence of the evolution of the system, such as: how to reuse the test artefacts, and how to select the relevant tests for implementing the new version of the system. In this context, this work proposes a process called D-MBTDD in which the agile development of a system is guided by model-based tests, focusing on helping with the reuse of test artefacts and on the process of identifying tests relevant to development. The information about the modifications between two versions of the test model are used in this approach, which was compared to the Regenerate-All approach, which regenerates test cases along the iterations and does not reuse any of them.
dc.description39
dc.description46
dc.description46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)
dc.descriptionJUN 28-JUL 01, 2016
dc.descriptionToulouse, FRANCE
dc.description
dc.languageEnglish
dc.publisherIEEE
dc.publisherNew York
dc.relation2016 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)
dc.rightsfechado
dc.sourceWOS
dc.subjectModel-based Test Driven Development
dc.subjectEvolving System
dc.subjectAgile Development
dc.subjectIncremental Tests
dc.subjectTest Reuse
dc.subjectModel-based Regression Tests
dc.titleD-mbtdd: An Approach For Reusing Test Artefacts In Evolving Systems
dc.typeActas de congresos


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