dc.creatorGomes Porto
dc.creatorIury Bertollo; Yacoub
dc.creatorMichel Doud
dc.date2016
dc.datejul
dc.date2017-11-13T13:22:26Z
dc.date2017-11-13T13:22:26Z
dc.date.accessioned2018-03-29T05:55:12Z
dc.date.available2018-03-29T05:55:12Z
dc.identifierIeee Transactions On Wireless Communications. Ieee-inst Electrical Electronics Engineers Inc, v. 15, p. 4732 - 4744, 2016.
dc.identifier1536-1276
dc.identifier1558-2248
dc.identifierWOS:000381502100019
dc.identifier10.1109/TWC.2016.2544924
dc.identifierhttp://ieeexplore.ieee.org.ez88.periodicos.capes.gov.br/document/7438937/
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/327888
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1364913
dc.descriptionConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.descriptionA comprehensive study on the kappa-mu phase statistics is conducted. A substantial number of new formulas, exact and approximate, closed form, and integral form, are presented. In particular, a tight close-form approximation for the phase probability density function is found that yields results almost indistinguishable from the exact integral formulation. Most strikingly, the approximate formulation comprises the exact Nakagami-m phase as well as the exact Von Mises ( Tikhonov) densities. Joint statistics involving combinations of the envelope, phase, and their time derivatives are derived in an exact manner. The exact phase crossing rate is then obtained in an integral form. A closed-form approximation is proposed that yields very good results as compared to the exact formulation. A Monte Carlo simulation plot is used to validate the formula of the exact phase crossing rate. The formulations presented here drastically facilitate the use of the phase statistics of the kappa-mu fading model.
dc.description15
dc.description7
dc.description4732
dc.description4744
dc.descriptionNational Council for Scientific and Technological Development (CNPq) [143629/2010-7]
dc.descriptionConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.languageEnglish
dc.publisherIEEE-Inst Electrical Electronics Engineers Inc
dc.publisherPiscataway
dc.relationIEEE Transactions on Wireless Communications
dc.rightsfechado
dc.sourceWOS
dc.subjectHigher Order Statistics
dc.subjectPhase Crossing Rate
dc.subjectPhase Statistics
dc.subjectTikhonov Distribution
dc.subjectVon Mises Distribution
dc.subjectKappa-mu Distribution
dc.titleOn The Phase Statistics Of The Kappa-mu Process
dc.typeArtículos de revistas


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