Use Of Specklegrams Background Terms For Speckle Photography Combined With Phase-shifting Electronic Speckle Pattern Interferometry

dc.creatorZemmamouche
dc.creatorRedouane; Vandenrijt
dc.creatorJean-Francois; Medjahed
dc.creatorAicha; de Oliveira
dc.creatorIvan; Georges
dc.creatorMarc P.
dc.date2015-AUG
dc.date2016-06-07T13:34:43Z
dc.date2016-06-07T13:34:43Z
dc.date.accessioned2018-03-29T01:50:20Z
dc.date.available2018-03-29T01:50:20Z
dc.identifier
dc.identifierUse Of Specklegrams Background Terms For Speckle Photography Combined With Phase-shifting Electronic Speckle Pattern Interferometry. Spie-soc Photo-optical Instrumentation Engineers, v. 54, p. AUG-2015.
dc.identifier0091-3286
dc.identifierWOS:000362507000024
dc.identifier10.1117/1.OE.54.8.084110
dc.identifierhttp://spiedigitallibrary.org/Solr/searchresults.aspx?q=Speckle
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/243971
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1307669
dc.descriptionFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.descriptionElectronic speckle pattern interferometry (ESPI) is combined with digital speckle photography (DSP) to measure out-of-plane deformation in the presence of large in-plane translation or rotation. ESPI is used to measure out-of-plane displacements smaller than the speckle diameter. In-plane displacements larger than the speckle size are obtained by DSP using artifacts images computed from the phase-stepped specklegrams. Previous works use the specklegram modulation for that purpose, but we show that this can lead to errors in the case of low modulation. In order to avoid this, a simple averaging of phase-stepped specklegrams allows obtaining the average irradiance, which contains information on the speckled object image. The latter can be used more efficiently than the modulation in DSP and is simpler to compute. We also perform a numerical simulation of specklegrams, which show that the use of background terms is much more stable against some error sources as compared to modulation. We show experimental evidence of this in various experiments combining out-of-plane ESPI measurements with in-plane translations or rotations obtained by our DSP method. The latter has been used efficiently to restore phase loss in out-of-plane ESPI measurements due to large in-plane displacements. (C) 2015 Society of Photo-Optical Instrumentation Engineers (SPIE)
dc.description54
dc.description8
dc.description
dc.description
dc.description
dc.descriptionMinistry of Higher Education and Scientific Research of Algeria
dc.descriptionUniversity of M'SILA
dc.descriptionInstitut National d'Optique et Mecanique de Precision of Setif University
dc.descriptionFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.descriptionFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description
dc.description
dc.description
dc.languageen
dc.publisherSPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
dc.publisher
dc.publisherBELLINGHAM
dc.relationOPTICAL ENGINEERING
dc.rightsaberto
dc.sourceWOS
dc.subjectTv Holography
dc.subjectDisplacement
dc.subjectAccuracy
dc.titleUse Of Specklegrams Background Terms For Speckle Photography Combined With Phase-shifting Electronic Speckle Pattern Interferometry
dc.typeArtículos de revistas


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