Grazing-incidence Xrf Analysis Of Layered Samples: Detailed Study Of Amplitude Calculation

dc.creatorMiqueles
dc.creatorEduardo X.; Perez
dc.creatorCarlos A.; Suarez
dc.creatorVanessa I.; Vescovi
dc.creatorRafael F. C.
dc.date2015-SEP
dc.date2016-06-07T13:20:57Z
dc.date2016-06-07T13:20:57Z
dc.date.accessioned2018-03-29T01:40:53Z
dc.date.available2018-03-29T01:40:53Z
dc.identifier
dc.identifierGrazing-incidence Xrf Analysis Of Layered Samples: Detailed Study Of Amplitude Calculation. Elsevier Science Bv, v. 194, p. 33-42 SEP-2015.
dc.identifier0010-4655
dc.identifierWOS:000356196000004
dc.identifier10.1016/j.cpc.2015.03.025
dc.identifierhttp://www.sciencedirect.com/science/article/pii/S001046551500140X
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/242989
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1306687
dc.descriptionIn this article, we propose a new mathematical approach for the computation of electromagnetic wave amplitudes in grazing incidence X-ray fluorescence (GIXRF)-an analytical method for surface and near-surface layer analysis. The new contribution comes from an applied point of view, in order to have stable and fast algorithms to simulate the fluorescence intensity from a stacking of thin layer films. The calculation of transmitted/reflected amplitudes is an important part of the direct and/or inverse problem. An analysis of the amplitude versus layer thickness is also given. (C) 2015 Elsevier B.V. All rights reserved.
dc.description194
dc.description
dc.description
dc.description33
dc.description42
dc.description
dc.description
dc.description
dc.languageen
dc.publisherELSEVIER SCIENCE BV
dc.publisher
dc.publisherAMSTERDAM
dc.relationCOMPUTER PHYSICS COMMUNICATIONS
dc.rightsembargo
dc.sourceWOS
dc.subjectX-ray-fluorescence
dc.subjectSurface-analysis
dc.subjectInversion
dc.titleGrazing-incidence Xrf Analysis Of Layered Samples: Detailed Study Of Amplitude Calculation
dc.typeArtículos de revistas


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