dc.creatorClaudio
dc.creatorKleucio; Silva-Santos
dc.creatorCarlos H.; Goncalves
dc.creatorMarcos S.; Hernandez-Figueroa
dc.creatorHugo E.
dc.date2015-JUN
dc.date2016-06-07T13:16:04Z
dc.date2016-06-07T13:16:04Z
dc.date.accessioned2018-03-29T01:36:41Z
dc.date.available2018-03-29T01:36:41Z
dc.identifier
dc.identifierFinite Element Method To Improve The Computational Performance In Optical Devices Analysis. Wiley-blackwell, v. 57, p. 1423-1426 JUN-2015.
dc.identifier0895-2477
dc.identifierWOS:000351834200037
dc.identifier10.1002/mop.29103
dc.identifierhttp://onlinelibrary.wiley.com/doi/10.1002/mop.29103/abstract
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/241993
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1305691
dc.descriptionCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.descriptionFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.descriptionThis work presents a robust bidimensional finite element method (FEM) to disassembly and assembly only modified elements in global matrix. It integrates biconjugate gradient stabilized iterative method and incomplete LU threshold preconditioner to solve linear systems for nondiagonal sparse matrixes, decreasing FEM runtime around 70% in some applications. (c) 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:1423-1426, 2015
dc.description57
dc.description6
dc.description
dc.description1423
dc.description1426
dc.descriptionCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.descriptionFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.descriptionCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.descriptionFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description
dc.description
dc.description
dc.languageen
dc.publisherWILEY-BLACKWELL
dc.publisher
dc.publisherHOBOKEN
dc.relationMICROWAVE AND OPTICAL TECHNOLOGY LETTERS
dc.rightsfechado
dc.sourceWOS
dc.subjectPerfectly Matched Layer
dc.titleFinite Element Method To Improve The Computational Performance In Optical Devices Analysis
dc.typeArtículos de revistas


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