dc.creatorTenan, MA
dc.creatorSoares, DM
dc.date1998
dc.dateDEC
dc.date2014-12-02T16:27:36Z
dc.date2015-11-26T18:05:32Z
dc.date2014-12-02T16:27:36Z
dc.date2015-11-26T18:05:32Z
dc.date.accessioned2018-03-29T00:47:51Z
dc.date.available2018-03-29T00:47:51Z
dc.identifierBrazilian Journal Of Physics. Sociedade Brasileira Fisica, v. 28, n. 4, n. 405, n. 412, 1998.
dc.identifier0103-9733
dc.identifierWOS:000078321700015
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/72308
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/72308
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/72308
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1293164
dc.descriptionTechniques based upon the electrical response of the quartz crystal microbalance (QCM) have been widely used in laboratories as routine tools. In this article we present and discuss applications of the QCM (or its variant, the electrochemical quartz crystal microbalance, EQCM) to the viscoelastic characterization of films. It is pointed out that correlations between the motion of quartz crystal and contacting films and overlayers as well as the influence of the electronic circuit on the electric state of the whole system are of fundamental importance in interpreting the results.
dc.description28
dc.description4
dc.description405
dc.description412
dc.languageen
dc.publisherSociedade Brasileira Fisica
dc.publisherSao Paulo
dc.publisherBrasil
dc.relationBrazilian Journal Of Physics
dc.relationBraz. J. Phys.
dc.rightsfechado
dc.sourceWeb of Science
dc.subjectThickness-shear Mode
dc.subjectViscoelastic Properties
dc.subjectPiezoelectric-crystals
dc.subjectEquivalent-circuit
dc.subjectResonators
dc.subjectLiquids
dc.subjectOscillator
dc.subjectFrequency
dc.subjectViscosity
dc.subjectImpedance
dc.titleThe quartz crystal microbalance: a tool for probing viscous/viscoelastic properties of thin films
dc.typeArtículos de revistas


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