Molecular arrangements of self-assembled surfactant films: Characterization from atomic force microscopy data

dc.creatorTeschke, O
dc.creatorde Souza, EF
dc.date2003
dc.dateSEP
dc.date2014-11-17T01:20:18Z
dc.date2015-11-26T18:05:30Z
dc.date2014-11-17T01:20:18Z
dc.date2015-11-26T18:05:30Z
dc.date.accessioned2018-03-29T00:47:48Z
dc.date.available2018-03-29T00:47:48Z
dc.identifierPhysical Review E. Amer Physical Soc, v. 68, n. 3, 2003.
dc.identifier1539-3755
dc.identifierWOS:000185756000025
dc.identifier10.1103/PhysRevE.68.031401
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/57726
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/57726
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/57726
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1293153
dc.descriptionThe adsorbed surfactant film molecular arrangement with thickness of similar to5 nm is determined by measurements of the film dielectric permittivity. Before the advent of atomic force microscopy the dielectric permittivity was a macroscopic parameter, appropriate only for describing uniform environments since its profile was difficult to measure for local intermolecular interactions and its spatial distribution was frequently settled without experimental justification. Here, we show that atomic force microscopy made it possible to measure the dielectric permittivity profile in a scale below 5 nm for adsorbed layers of self-assembled surfactant films in water. The measured values of the film's dielectric permittivity and the film's thickness determine the compactness of the adsorbed film and consequently the presence of water molecules in the film and the conformal structure of the adsorbed molecules.
dc.description68
dc.description3
dc.description1
dc.languageen
dc.publisherAmer Physical Soc
dc.publisherCollege Pk
dc.publisherEUA
dc.relationPhysical Review E
dc.relationPhys. Rev. E
dc.rightsaberto
dc.rightshttp://publish.aps.org/authors/transfer-of-copyright-agreement
dc.sourceWeb of Science
dc.subjectSolid-liquid Interfaces
dc.subjectElectrical Double-layer
dc.subjectSolid/liquid Interfaces
dc.subjectDielectric Exchange
dc.subjectNeutron Reflection
dc.subjectBromide
dc.subjectResolution
dc.subjectAdsorption
dc.subjectSilicon
dc.subjectOrganization
dc.titleMolecular arrangements of self-assembled surfactant films: Characterization from atomic force microscopy data
dc.typeArtículos de revistas


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