A simple method to determine the optical constants and thicknesses of ZnxCd1-xS thin films

dc.creatorTorres, J
dc.creatorCisneros, JI
dc.creatorGordillo, G
dc.creatorAlvarez, F
dc.date1996
dc.date11263
dc.date2014-12-16T11:33:47Z
dc.date2015-11-26T17:56:05Z
dc.date2014-12-16T11:33:47Z
dc.date2015-11-26T17:56:05Z
dc.date.accessioned2018-03-29T00:39:47Z
dc.date.available2018-03-29T00:39:47Z
dc.identifierThin Solid Films. Elsevier Science Sa, v. 289, n. 41671, n. 238, n. 241, 1996.
dc.identifier0040-6090
dc.identifierWOS:A1996WB26500042
dc.identifier10.1016/S0040-6090(96)08931-6
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/53777
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/53777
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/53777
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1291176
dc.descriptionA new method to determine the optical parameters of ZnxCd1-xS polycrystalline thin films is proposed. Sub-gap absorption, caused by acceptor states, is taken into account in the determination of the refractive index and film thickness. This procedure avoids errors in the results, frequently observed when the absorption is ignored. In the low and medium absorption region the refractive index is parametrized by the Wemple and DiDomenico (W-D) single oscillator model. The W-D parameters are further used in order to extrapolate the refractive index at the absorption edge to compute the absorption coefficient and the optical gap. The transmission spectra of typical CdS, (Zn,Cd)S and ZnS thin films and their corresponding values of n, alpha and E(g) are presented.
dc.description289
dc.description41671
dc.description238
dc.description241
dc.languageen
dc.publisherElsevier Science Sa
dc.publisherLausanne
dc.publisherSuíça
dc.relationThin Solid Films
dc.relationThin Solid Films
dc.rightsfechado
dc.rightshttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dc.sourceWeb of Science
dc.subjectcadmium sulphide
dc.subjectevaporation
dc.subjectinorganic compounds
dc.subjectoptical properties
dc.subjectoptical spectroscopy
dc.subjectsemiconductors
dc.subjectsolar cells
dc.subjectsulfides
dc.subjectvacancies
dc.subjectAmorphous-silicon
dc.titleA simple method to determine the optical constants and thicknesses of ZnxCd1-xS thin films
dc.typeArtículos de revistas


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