Al-based anodic oxide films structure observation using field emission gun scanning electron microscopy

dc.creatorRegone, NN
dc.creatorFreire, CMA
dc.creatorBallester, M
dc.date2006
dc.dateFEB 20
dc.date2014-11-15T02:03:08Z
dc.date2015-11-26T17:35:44Z
dc.date2014-11-15T02:03:08Z
dc.date2015-11-26T17:35:44Z
dc.date.accessioned2018-03-29T00:17:50Z
dc.date.available2018-03-29T00:17:50Z
dc.identifierJournal Of Materials Processing Technology. Elsevier Science Sa, v. 172, n. 1, n. 146, n. 151, 2006.
dc.identifier0924-0136
dc.identifierWOS:000235379700019
dc.identifier10.1016/j.jmatprotec.2005.09.005
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/77111
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/77111
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/77111
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1285635
dc.descriptionIn the present work, the anodic oxide films of Al, Al-Cu 4.5% and Al-Si 6.5% alloys are formed using direct and pulse current. In the case of Al-Cu and Al-Si alloys, the electrolyte used contains sulfuric acid and oxalic acid, meanwhile for Al the electrolyte contains sulfuric acid only. Al-Cu alloy was submitted to a heat treatment in order to decrease the effect of inter metallic phase theta upon the anodic film structure. Fractured samples were observed using a field emission gun scanning electron microscope JSM-6330F at (LME)/Brazilian Synchrotron Light Laboratory (LNLS), Campinas, SP, Brazil. The oxide film images enable evaluation of the pore size and form with a resolution similar to the transmission electron microscope (TEM) resolution. It is also observed that the anodizing process using pulse current produces an irregular structure of pore walls, and by direct cur-rent it is produced a rectilinear pore wall. (c) 2005 Elsevier B.V. All rights reserved.
dc.description172
dc.description1
dc.description146
dc.description151
dc.languageen
dc.publisherElsevier Science Sa
dc.publisherLausanne
dc.publisherSuíça
dc.relationJournal Of Materials Processing Technology
dc.relationJ. Mater. Process. Technol.
dc.rightsfechado
dc.rightshttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dc.sourceWeb of Science
dc.subjectanodizing
dc.subjectfield emission gun microscopy
dc.subjectaluminum
dc.subjectAl-Cu alloy
dc.subjectAl-Si alloy
dc.subjectCu Alloys
dc.subjectAluminum-alloy
dc.subjectOxidation
dc.subjectMorphology
dc.subjectCopper
dc.titleAl-based anodic oxide films structure observation using field emission gun scanning electron microscopy
dc.typeArtículos de revistas


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