dc.creatorLunazzi, JJ
dc.creatorRivera, NI
dc.date2006
dc.dateMAY
dc.date2014-11-16T11:22:46Z
dc.date2015-11-26T17:24:40Z
dc.date2014-11-16T11:22:46Z
dc.date2015-11-26T17:24:40Z
dc.date.accessioned2018-03-29T00:11:57Z
dc.date.available2018-03-29T00:11:57Z
dc.identifierJournal Of The Optical Society Of America A-optics Image Science And Vision. Optical Soc Amer, v. 23, n. 5, n. 1021, n. 1026, 2006.
dc.identifier1084-7529
dc.identifierWOS:000237303600005
dc.identifier10.1364/JOSAA.23.001021
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/58386
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/58386
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/58386
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1284137
dc.descriptionPseudoscopic (inverted depth) images that keep a continuous parallax were shown to be possible by use of a double diffraction process intermediated by a slit. One diffraction grating directing light to the slit acts as a wavelength encoder of views, while a second diffraction grating decodes the projected image. The process results in the enlargement of the image under common white light illumination up to infinite magnification at a critical point. We show that this point corresponds to another simple-symmetry object-observer system. Our treatment allows us to explain the experience by just dealing with main ray directions. (C) 2006 Optical Society of America.
dc.description23
dc.description5
dc.description1021
dc.description1026
dc.languageen
dc.publisherOptical Soc Amer
dc.publisherWashington
dc.publisherEUA
dc.relationJournal Of The Optical Society Of America A-optics Image Science And Vision
dc.relationJ. Opt. Soc. Am. A-Opt. Image Sci. Vis.
dc.rightsaberto
dc.sourceWeb of Science
dc.titlePseudoscopic imaging in a double diffraction process with a slit: critical point properties
dc.typeArtículos de revistas


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