dc.creator | Lunazzi, JJ | |
dc.creator | Rivera, NI | |
dc.date | 2006 | |
dc.date | MAY | |
dc.date | 2014-11-16T11:22:46Z | |
dc.date | 2015-11-26T17:24:40Z | |
dc.date | 2014-11-16T11:22:46Z | |
dc.date | 2015-11-26T17:24:40Z | |
dc.date.accessioned | 2018-03-29T00:11:57Z | |
dc.date.available | 2018-03-29T00:11:57Z | |
dc.identifier | Journal Of The Optical Society Of America A-optics Image Science And Vision. Optical Soc Amer, v. 23, n. 5, n. 1021, n. 1026, 2006. | |
dc.identifier | 1084-7529 | |
dc.identifier | WOS:000237303600005 | |
dc.identifier | 10.1364/JOSAA.23.001021 | |
dc.identifier | http://www.repositorio.unicamp.br/jspui/handle/REPOSIP/58386 | |
dc.identifier | http://www.repositorio.unicamp.br/handle/REPOSIP/58386 | |
dc.identifier | http://repositorio.unicamp.br/jspui/handle/REPOSIP/58386 | |
dc.identifier.uri | http://repositorioslatinoamericanos.uchile.cl/handle/2250/1284137 | |
dc.description | Pseudoscopic (inverted depth) images that keep a continuous parallax were shown to be possible by use of a double diffraction process intermediated by a slit. One diffraction grating directing light to the slit acts as a wavelength encoder of views, while a second diffraction grating decodes the projected image. The process results in the enlargement of the image under common white light illumination up to infinite magnification at a critical point. We show that this point corresponds to another simple-symmetry object-observer system. Our treatment allows us to explain the experience by just dealing with main ray directions. (C) 2006 Optical Society of America. | |
dc.description | 23 | |
dc.description | 5 | |
dc.description | 1021 | |
dc.description | 1026 | |
dc.language | en | |
dc.publisher | Optical Soc Amer | |
dc.publisher | Washington | |
dc.publisher | EUA | |
dc.relation | Journal Of The Optical Society Of America A-optics Image Science And Vision | |
dc.relation | J. Opt. Soc. Am. A-Opt. Image Sci. Vis. | |
dc.rights | aberto | |
dc.source | Web of Science | |
dc.title | Pseudoscopic imaging in a double diffraction process with a slit: critical point properties | |
dc.type | Artículos de revistas | |