dc.creatorTeschke, O
dc.creatorSouza, EF
dc.date1998
dc.dateOCT
dc.date2014-12-02T16:25:48Z
dc.date2015-11-26T17:23:41Z
dc.date2014-12-02T16:25:48Z
dc.date2015-11-26T17:23:41Z
dc.date.accessioned2018-03-29T00:11:00Z
dc.date.available2018-03-29T00:11:00Z
dc.identifierReview Of Scientific Instruments. Amer Inst Physics, v. 69, n. 10, n. 3588, n. 3592, 1998.
dc.identifier0034-6748
dc.identifierWOS:000076430000021
dc.identifier10.1063/1.1149143
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/55134
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/55134
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/55134
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1283888
dc.descriptionThe minimum scanning speed of atomic force microscopes for improved atomic resolution has been measured in liquid media, and shown to be equal to 100 nm/s for mica immersed in water corresponding to the time spent scanning the distance between two neighbor ions (similar to 0.52 nm) of similar to 5 ms. The scanning velocity dependence of the force acting on the tip in the double-layer region (similar to 135 nm) when it approaches the surface was also measured. The stationary component of this force, for scanning speeds up to 30 mu m/s, was identified as the exchange of the liquid media with epsilon approximate to 80 by the tip with epsilon approximate to 6. As the tip approaches the surface and as well as when the tip images atomic features, this repulsive force shows a relaxation time of a few milliseconds, corresponding to the shielding of the surface charge by the solution, i.e., the double-layer relaxation time. Scanning surfaces at speeds higher than the ratio of the atomic features distance and this relaxation time results in a variable repulsive force acting on the tip, as a function the scanning speed, which might be used to improve the atomic imaging resolution. (C) 1998 American Institute of Physics. [S0034-6748(98)04010-6].
dc.description69
dc.description10
dc.description3588
dc.description3592
dc.languageen
dc.publisherAmer Inst Physics
dc.publisherWoodbury
dc.publisherEUA
dc.relationReview Of Scientific Instruments
dc.relationRev. Sci. Instrum.
dc.rightsaberto
dc.sourceWeb of Science
dc.subjectDouble-layer Relaxation
dc.subjectElectrolyte-solutions
dc.subjectHydration Forces
dc.subjectVanderwaals
dc.subjectSurfaces
dc.titleAtomic force microscopy improved resolution employing large scanning speeds: Effects of the double relaxation time
dc.typeArtículos de revistas


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