dc.creatorDias, US
dc.creatorYacoub, MD
dc.date2010
dc.dateJAN
dc.date2014-11-14T13:42:51Z
dc.date2015-11-26T17:15:09Z
dc.date2014-11-14T13:42:51Z
dc.date2015-11-26T17:15:09Z
dc.date.accessioned2018-03-29T00:03:25Z
dc.date.available2018-03-29T00:03:25Z
dc.identifierIeee Transactions On Communications. Ieee-inst Electrical Electronics Engineers Inc, v. 58, n. 1, n. 40, n. 45, 2010.
dc.identifier0090-6778
dc.identifierWOS:000273936500007
dc.identifier10.1109/TCOMM.2010.01.080175
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/73583
dc.identifierhttp://www.repositorio.unicamp.br/handle/REPOSIP/73583
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/73583
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1281975
dc.descriptionFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.descriptionThis paper derives an exact closed-form expression for the phase-envelope joint distribution of the kappa-mu fading environment, a general fading model that includes the Rice and the Nakagami-m models as special cases. The derived joint statistics are obtained so that compatibility with both Rice as well as Nakagami-m cases are kept. Monte Carlo simulation plots are presented that are in accordance with the formulations developed here. As a consequence of the derivation of the required PDF, an interesting solution to a very general probability problem is proposed, namely, given the PDF of the modulus of a variate, find the PDF of the variate. Additionally, several new integral relations of the modified Bessel function are given.
dc.description58
dc.description1
dc.description40
dc.description45
dc.descriptionFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.descriptionFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.descriptionFAPESP [06/06825-8]
dc.languageen
dc.publisherIeee-inst Electrical Electronics Engineers Inc
dc.publisherPiscataway
dc.publisherEUA
dc.relationIeee Transactions On Communications
dc.relationIEEE Trans. Commun.
dc.rightsfechado
dc.rightshttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dc.sourceWeb of Science
dc.subjectGeneral fading distribution
dc.subjectkappa-mu distribution
dc.subjectM Fading Channel
dc.subjectError
dc.subjectNoise
dc.titleThe kappa-mu Phase-Envelope Joint Distribution
dc.typeArtículos de revistas


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