An instrument for combining x-ray multiple diffraction and x-ray topographic imaging for examining crystal microcrystallography and perfection

dc.creatorLai, X
dc.creatorMa, CY
dc.creatorRoberts, KJ
dc.creatorCardoso, LP
dc.creatordos Santos, AO
dc.creatorBogg, D
dc.creatorMiller, MC
dc.date2009
dc.dateMAR
dc.date2014-07-30T13:48:44Z
dc.date2015-11-26T17:09:07Z
dc.date2014-07-30T13:48:44Z
dc.date2015-11-26T17:09:07Z
dc.date.accessioned2018-03-28T23:57:46Z
dc.date.available2018-03-28T23:57:46Z
dc.identifierReview Of Scientific Instruments. Amer Inst Physics, v. 80, n. 3, 2009.
dc.identifier0034-6748
dc.identifierWOS:000264776600025
dc.identifier10.1063/1.3103571
dc.identifierhttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/54442
dc.identifierhttp://repositorio.unicamp.br/jspui/handle/REPOSIP/54442
dc.identifier.urihttp://repositorioslatinoamericanos.uchile.cl/handle/2250/1280547
dc.descriptionDiffraction imaging using x-ray topography (XRT) and x-ray multiple diffraction (XRMD) provide valuable tools for examining the growth defects in crystals and the distributions from ideal lattice symmetry (microcrystallography). The topographic x-ray multiple diffraction microprobe (TMDM) combines the complementary aspects of both techniques enabling XRT and XRMD studies within the same instrument providing a useful resource for the structural characterization of materials that are not very stable in vacuum and electron beam environments. The design of the TMDM instrument is described together with data taken on GaAs (001) and potassium dihydrogen phosphate (001).
dc.description80
dc.description3
dc.descriptionEPSRC, U.K. [GR/R/65787/01]
dc.descriptionEPSRC, U.K. [GR/R/65787/01]
dc.languageen
dc.publisherAmer Inst Physics
dc.publisherMelville
dc.publisherEUA
dc.relationReview Of Scientific Instruments
dc.relationRev. Sci. Instrum.
dc.rightsaberto
dc.sourceWeb of Science
dc.subjectcrystal defects
dc.subjectcrystal morphology
dc.subjectcrystal symmetry
dc.subjectgallium arsenide
dc.subjectIII-V semiconductors
dc.subjectpotassium compounds
dc.subjectX-ray diffraction
dc.subjectX-ray diffractometers
dc.subjectX-ray topography
dc.subjectPotassium Dihydrogen Phosphate
dc.subjectSimultaneous Bragg-diffraction
dc.subjectNonlinear-optical Material
dc.subjectRenninger Scanning-mode
dc.subjectSynchrotron-radiation
dc.subjectEpitaxial Layers
dc.subjectPhase Problem
dc.subjectSimultaneous Reflections
dc.subjectHabit Modification
dc.subjectSingle-crystals
dc.titleAn instrument for combining x-ray multiple diffraction and x-ray topographic imaging for examining crystal microcrystallography and perfection
dc.typeArtículos de revistas


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